Many test floors collect data from their testers during normal operation and process the information into a "status" view of their test floor. To make the RI 7100A tester easier to integrate into these systems, we have added a report which is created during the operation of the tester.
During the operation of a test executive, the RI tester will write a file called "SNAPSHOT.CSV" into the directory D:\RiApps\Testdata\LotSummary. This file is written every ten parts with new lot summary data. It shows the total parts tested, the hard and soft bin counts, and much more. The file is in the same format as other "lot summary" files. It is a comma separated variable file which has a fixed spacing for all of the items in the file. The row and column numbers never change from one version of the RI software to the next, so customers can create their own programs which use the CSV file and not have to worry about updates.
What follows is an example from a SNAPSHOT.CSV file. The blank rows in the file are to provide for future expansion while keeping important items on fixed row numbers -- such as hard and soft bins. This file is written every 10 parts tested. It is opened with permissions that will allow another program to read the file even as it is being written. This feature was tested by opening the file with a text editor over and over while the program ran. It always opened properly and read the entire file. Writing the file takes only a few milliseconds, so there is no impact on test time.
Here is a sample of the SNAPSHOT.CSV file, rendered as a table for easier viewing:
![]() | ![]() |
Title | Device all duts tested on 06/13/06 - 11:03:35 am exec: 01 lot: lotname sublot: sublot name |
Date | 6/13/2006 |
Time | 11:03:35 AM |
Operator | Joe Barnhart |
System | Sys#40_12GHz_20C |
Device | all duts |
Fixture | |
DeviceIF | |
Handler | Handler |
Testexec | 1 |
Primary Testplan | 1 |
Standard Limits | Limits |
Premium Limits | |
Continuity Testplan | |
Continuity Limits | |
Aux Testplan | |
Wafer | |
Lot | lotname |
Sublot | sublot name |
Comment | |
Pass | 3 |
Fail | 47 |
Tested | 50 |
Yield | 6 |
Avg. Test Time | 5.20E-03 |
Avg. Wait Time | 2.56E-01 |
Data Logged | FALSE |
Bin 1 | 3 |
Bin 2 | 10 |
Bin 3 | 0 |
Bin 4 | 0 |
Bin 5 | 0 |
Bin 6 | 0 |
Bin 7 | 0 |
Bin 8 | 0 |
Bin 9 | 0 |
Bin 10 | 0 |
Bin 11 | 0 |
Bin 12 | 0 |
Standard Pass | 3 |
Premium Pass | 0 |
Standard Fail | 10 |
Continuity Fail | 0 |
Joes test | 37 |
Special Fail 2 | 0 |
Special Fail 3 | 0 |
Special Fail 4 | 0 |
Special Fail 5 | 0 |
Special Fail 6 | 0 |
Special Fail 7 | 0 |
Special Fail 8 | 0 |
Special Fail 9 | 0 |
Special Fail 10 | 0 |
Special Fail 11 | 0 |
Special Fail 12 | 0 |
Special Fail 13 | 0 |
Special Fail 14 | 0 |
Special Fail 15 | 0 |
Special Fail 16 | 0 |
Special Fail 17 | 0 |
Special Fail 18 | 0 |
Special Fail 19 | 0 |
Special Fail 20 | 0 |
Special Fail 21 | 0 |
Special Fail 22 | 0 |
Special Fail 23 | 0 |
Special Fail 24 | 0 |
Special Fail 25 | 0 |
Special Fail 26 | 0 |
Special Fail 27 | 0 |
Special Fail 28 | 0 |
Special Fail 29 | 0 |
Special Fail 30 | 0 |
Special Fail 31 | 0 |
Special Fail 32 | 0 |