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Using the Measure Loop group is specifically intended to improve compile time and reduce memory consumption by up to 70%. What it does is for measurements where we set of some conditions and then sweep some states and expect a sweep vector as a result, the sweep part is generated behind the scenes and the compiler only handles the set conditions. This both reduces the compile time and memory usage. This is helpful for when there are device instructions (SPI Write) that are emitted prior to a Measure Sequence group, while also sweeping frequency and/or power or iterating over a large number of switched paths. Expected run time is the same since the total number of actual measurements the instruments make are still the same, it simply bundles the measurements that the compiler sees. Does not affect measurement results.



For example, a test section before using the Measure Loop group was generating more than 600 tests and took 16 seconds to compile was reduced to 80 tests and 5 seconds to compile, that is 70% improvement when the Measure Loop group was added.

Requirements: Cassini Patch 358 - Measure Sweep (first available Feb 2026)

Each Measure Loop must specify the sort order by choosing the Index Setting state menu and then optionally assigning a variable name with the Index Var menu. Right Click in the

How to Use Measure Loop:
1. Select multiple states or sweeps, lock steps, or any other combination of states and choose Group Selected from the right mouse button menu. (See Figure 1)
2. Choose meas loop and a new Measure Loop group will appear around the selected states. (See Figure 2)
3. (Optional) Right click in the white space just inside the newly created group and select Index Setting to define a single index value (sort order). Choose any state defined in the group that can be used to pull out a specific value later or will be appended to the Data Save name to make it unique. (See Figure 2)
4. (Optional) Right click in the white space just inside the newly created group and select Index Var to define a variable to store the array of states in the group. This is only useful for calculations that would require that information and would conserve memory when excluded.


Figure 1: Group Selected



Figure 2: meas loop


Figure 3: Index Setting and Index Var


Figure 4: Measure Loop Indexed by System Index


Example Testplan: Measure Loop Group
Measure_Loop_Group.RiTestplan.gzpMeasure_Loop_Group.RiTestplan.gzp

Hide details for Compile Timing with GroupsCompile Timing with Groups
Compile Timing with Groups
0.000 ms  Initializing 1.469 ms
1.469 ms  Section 'RF Tests':  Creating instrument settings 0.036 ms
1.505 ms  Section 'RF Tests':  Creating Data Flow Nodes 0.325 ms
1.831 ms  Section 'RF Tests':  Expanding instrument settings 18.242 ms
20.073 ms  Section 'RF Tests':  Creating measurements 6.702 ms
26.775 ms  Section 'RF Tests':  Sorting Tests By Cost Factor 4.687 ms
31.462 ms  Section 'RF Tests':  Combining Like Tests 69.648 ms
101.110 ms  Section 'RF Tests':  Generating Rifl 298.386 ms
399.496 ms  Performing simulation run 2680.000 ms
3079.496 ms  Finished 4400.000 ms

Memory Used = 19.714  MB max:125MB

Total Testplan Hardware timing
Total Tests 4
HW Setup Time 488.4 us
Settling Time 200 us
HW Meas Time 2196.7 us
 Measure delays 913.7 us
Computed HW Time 2.8851 ms
Calc time 0.110132057802   ms
Ovhd Time 1.10722794001   ms
Expected Time 4.10245999782   ms

Hide details for Compile Timing without GroupsCompile Timing without Groups
Compile Timing without Groups
0.000 ms  Initializing 2.044 ms
2.044 ms  Section 'RF Tests':  Creating instrument settings 0.057 ms
2.100 ms  Section 'RF Tests':  Creating Data Flow Nodes 0.884 ms
2.985 ms  Section 'RF Tests':  Expanding instrument settings 177.366 ms
180.351 ms  Section 'RF Tests':  Creating measurements 66.439 ms
246.790 ms  Section 'RF Tests':  Sorting Tests By Cost Factor 36.281 ms
283.071 ms  Section 'RF Tests':  Combining Like Tests 81.354 ms
364.424 ms  Section 'RF Tests':  Generating Rifl 500.506 ms
864.930 ms  Performing simulation run 2690.000 ms
3554.930 ms  Finished 4600.000 ms

Memory Used = 19.866  MB max:125MB

Total Testplan Hardware timing
Total Tests 31
HW Setup Time 6627.3 us
Settling Time 3800 us
HW Meas Time 21967.0 us
 Measure delays 9137.0 us
Computed HW Time 32.3943 ms
Calc time 0.600394954615   ms
Ovhd Time 6.23279069071   ms
Expected Time 39.2274856453   ms


Published: 02/27/2026 01:50:08 PM Modified: 02/27/2026 03:43:40 PM
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